Team > Prof. Dr. Axel Enders

Max Planck Institute for Microstructure Physics and Physics Department of the Martin Luther University - Halle, Germany (research advisor: Prof. J. Kirschner)
Stress measurements on epitaxial films in the monolayer and sub-monolayer limit.
Structural exploration of epitaxially grown films using in-situ electron diffraction methods.

Student assistant at the Max Planck Institute for Microstructure Physics - Halle, Germany
Computer programming, development of software for data analysis and image processing.
Set-up of the data acquisition for electron coincidence spectroscopy measurements.

Max-Planck-Institute for Microstructure Physics and Physics Department of the Martin Luther University - Halle, Germany
Ph.D. in Physics (Dr. rer. nat.), 1999
Area of Specialization: Magnetism of Nanostructures
Title of the Ph.D. thesis: "Mechanical stress and ferromagnetism in ultra thin films"

Martin-Luther-University - Halle / Wittenberg, Germany
Diploma Physicist, 1995
Area of Specialization: Surface Science
Title of the Diploma thesis: "Stress measurements on epitaxial films in the monolayer and sub-monolayer limit"

Luther Award of the Martin-Luther-University Halle-Wittenberg / Germany; for outstanding results achieved during the Ph.D. studies (Best student award)

"Otto Hahn" medal of the Max Planck society; for excellent research on Mechanical and magnetostrictive stress in ultrathin films

Selection for a Feodor - Lynen - scholarship of the Alexander von Humboldt foundation; used for postdoctoral research at the Simon Fraser University, Burnaby, Canada; Sept. 1999 - March 2001